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FEI Inspect F50 Field Emission SEM

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posted on 2023-02-23, 22:41 authored by Flinders University

Scanning Electron Microscopy (SEM) uses a beam of electrons to image to a much higher resolution than is possible with an optical microscope. High resolution SEM of samples can be combined with elemental mapping using Energy Dispersive X-ray spectroscopy (EDX). An Electron Backscatter Diffraction (EBSD) detector is also installed allowing measurements of grain orientation and boundaries in crystalline samples.

FEI Inspect F50 Field Emission SEM

  • Secondary Electron detector
  • Backscatter Electron detector
  • Amatek EDAX EDS detector
  • EDAX EBSD detector

Hosted by College of Science and Engineering, Flinders University

Funding

Government of South Australia

An advanced electron microscope facility for nanomaterials, functional materials and minerals

Australian Research Council

Find out more...

Microscopy Australia

History

Primary contact

SEM Facility Manager: alex.sibley@flinders.edu.au

Access Rights

For bookings please contact SEM Facility Manager

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